PROCESS CONTROL

In Semiconductor high demanding manufacturing environment your process needs to be controlled! 

 

Various process monitoring systems are needed to track your wafer production and save the equipment. Evaluation of variable process conditions and determination of their impact on your wafers output is crucial for you to win the quality products. 

The key metric to be used to evaluate your manufacturing process is improved yield. And the yield is directly connected with reducing your costs. 

CVD ENDPOINT DETECTION

Always find the optimal point to finish your cleaning process.

RF

POWER METER

To make your measurements faster, easier with unparalleled accuracy and repeatability.

THERMAL

COUPLE WAFER

Measure the right temperature inside your chamber with your customized TCW.

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